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SAE J1113-4:2020 pdf free

SAE J1113-4:2020 pdf free. Immunity to Radiated Electromagnetic Fields – Bulk Current Injection (BCI) Method
This SAE Standard defines a method for evaluating the immunity of automotive electrical/electronic devices to radiated electromagnetic fields coupled to the vehicle wiring harness. The method, called bulk current injection (BCI), uses a current probe to inject RF onto the wiring harness in the frequency range of 1 to 400 MHz. BCI is one of a number of test methods that can be used to simulate the electromagnetic field.
The DBCI test method is described below. The information below provides the general test methodology for performing DBCI. For detailed specifications such as frequency bands, severity levels, and probe positions, please refer to the manufacturer’s product EMC specifications. Please refer to ISO 1 1452-4 Annex A for injection probe calibration method.
The testing is performed using DBCI on wiring harness associated with each DUT connector or as specified in the manufacturer’s EMC test plan.
When performing DBCI, all power return wires of the DUT (single or multiple connectors) shall be terminated directly to the ground plane as ilustrated in Figure 1. The length of the power return wiring shall be 200 mm±50 mm. No power return wiring shall be routed around the BCI injection probe. However, the power return wiring may be left in the injection probe if the power and power return wiring are twisted or are part of a shielded multi-conductor cable (e.g.,LVDS). These special characteristics must be specified in the product’s engineering specification and reviewed/approved by the manufacturers. These special characteristics shall be documented in the EMC test plan.
DBCI shall be performed over the frequency range from 1 to 60 MHz, using two or more fixed injection probe positions.Typical positions between the injection probe and the DUT connector are 150 mm, 450 mm, and 750 mm.
The typical setup is shown in Figure 1 (please refer to manufacturer’s product EMC specifications for specific test configuration).SAE J1113-4 pdf free download.

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